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Outlier-Based Approaches for Intrinsic and External Plagiarism Detection. Gabriel Oberreuter, Gaston L’Huillier, Sebastián A. Ríos, Juan D. Velásquez

PUBLICADO EN: Knowlege-Based and Intelligent Information and Engineering Systems Volume 6882 of the series Lecture Notes in Computer Science pp 11-20
FECHA: 1 de Noviembre de 2011
AUTORES: Sebastián Ríos
TIPO: Conferencia Internacional
AREAS: Analítica de Datos
LINK: http://link.springer.com/chapter/10.1007%2F978-3-642-23863-5_2